Journals

Electrodeposition and characterization of CuInSe2/CdS multilayered thin films deposited on flexible substrate

Authors: 
Soare, V; Burada, M; Mitrica, D; Badilita, V; Stoiciu, F; Lungu, CP; Ghenescu, V; Rusu, MI; Antohe, S
Year: 
2010

Growth and characterization of nitrogen-doped TiO2 thin films prepared by reactive pulsed laser deposition

Authors: 
Sauthier, G; Ferrer, FJ; Figueras, A; Gyorgy, E
Year: 
2010
DOI: 
http://dx.doi.org/10.1016/j.tsf.2010.09.043

Physico-chemical Properties of Iron-oxide-dextrin Thin Films

Authors: 
Ciobanu, CS; Andronescu, E; Pall, L; Iconaru, SL; Gyorgy, E; Predoi, D
Year: 
2010

Considerations referring to materials types able to be used in gas-cooled fast reactors

Authors: 
Radulescu, L; Pavelescu, M; Bercea, S; Scarlat, F
Year: 
2010

Image Based "film" dosimetry in NILPRP SSDL

Authors: 
Scarlat, F; Scarisoreanu, A; Badita, E; Mitru, E
Year: 
2010
DOI: 
http://dx.doi.org/10.1016/j.radmeas.2010.09.005

Measurement with Hp(10) and H*(10) secondary standard chambers at NILPRP 7 MeV linear accelerator

Authors: 
Scarlat, F; Scarisoreanu, A; Badita, E; Mitru, E; Vasilache, R
Year: 
2010
DOI: 
http://dx.doi.org/10.1016/j.radmeas.2010.06.056

Lead-free ferroelectric thin films obtained by pulsed laser deposition

Authors: 
Scarisoreanu, ND; Craciun, F; Chis, A; Birjega, R; Moldovan, A; Galassi, C; Dinescu, M
Year: 
2010
DOI: 
http://dx.doi.org/10.1007/s00339-010-5933-4

Morphology of polyethylene nanolayers: a study by evanescent light microscopy

Authors: 
Lapsker, I; Mirchin, N; Gorodetsky, U; Popescu, SA; Peled, A; Duta, L; Dorcioman, G; Popescu, AC; Mihailescu, IN
Year: 
2010
DOI: 
http://dx.doi.org/10.1007/s10853-010-4463-y

Skin Layer Defects in Si by Optimized Treatment in Hydrogen RF Plasma

Authors: 
Ghica, C; Nistor, LC; Vizireanu, S; Dinescu, G; Moldovan, A; Dinescu, M
Year: 
2010
DOI: 
http://dx.doi.org/10.1002/ppap.201000066

Sensitized Yb3+ emission in, (Nd, Yb):Y3Al5O12 transparent ceramics

Authors: 
Lupei, V; Lupei, A; Gheorghe, C; Ikesue, A
Year: 
2010
DOI: 
http://dx.doi.org/10.1063/1.3525269
Syndicate content