Transmission electron microscopy analysis and electrical measurements of carbon thin films

Publication type:

Journal

Authors:

Oancea-Stanescu, IM; Ciupina, V; Prodan, G; Prodan, M; Caraiane, A; Dulgheru, N; Jepu, I; Lungu, CP

Year:

2010

Journal data

Journal:

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS

Vol.:

Pag.:

824 828