Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique
- 2012 |
- Publications |
- Journals
Publication type:
Journal
Year:
2012
DOI:
http://dx.doi.org/10.1166/jnn.2012.5788 Journal data
Journal:
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Vol.:
12
Pag.:
2668 2671