Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique

Publication type:

Journal

Authors:

Mirchin, N; Apter, B; Lapsker, I; Fogel, V; Gorodetsky, U; Popescu, SA; Peled, A; Popescu-Pelin, G; Dorcioman, G; Duta, L; Popescu, A; Mihailescu, IN

Year:

2012

DOI:

http://dx.doi.org/10.1166/jnn.2012.5788

Journal data

Journal:

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY

Vol.:

Pag.:

2668 2671