MEASUREMENT OF THE NONLINEAR REFRACTIVE INDEX OF SOME SILICON NANOSTRUCTURES USING REFLECTION INTENSITY SCAN METHOD

Publication type: 
Journal
Authors: 
Rujoiu, TB; Vlad, VI; Petris, A
Year: 
2013

Journal data

Journal: 
ROMANIAN REPORTS IN PHYSICS
Vol.: 
65
Pag.: 
954 965