OPTICAL AND STRUCTURAL CHARACTERIZATION OF YSZ THIN FILMS DEPOSITED BY EXCIMER LASER ABLATION FOR PLANAR POTENTIOMETRIC OXYGEN SENSORS APPLICATIONS
- 2016 |
- Publications |
- Journals
Publication type:
Journal
Year:
2016 Journal data
Journal:
ROMANIAN REPORTS IN PHYSICS
Vol.:
68
Pag.:
1189 1196