Orientation of the nanocrystallites in AlN thin film determined by FTIR spectroscopy

Publication type:

Journal

Authors:

Antonova, K; Szekeres, A; Duta, L; Stan, GE; Mihailescu, N; Mihailescu, IN

Year:

2016

DOI:

http://dx.doi.org/10.1088/1742-6596/682/1/012024

Journal data

Journal:

INERA CONFERENCE 2015: LIGHT IN NANOSCIENCE AND NANOTECHNOLOGY (LNN 2015)

Vol.:

682

Pag.:

12024