Optical characterization of PLD deposited oxides thin films: comparison of VASE and AFM roughness measurement on YSZ and Ni-YSZ thin films

Publication type: 
Conference / Workshop
Authors: 
R. Pascu, A. Moldovan, M. Dinescu
Year: 
2012

Conference / Workshop data

Conference / Workshop: 
7th Workshop Ellipsometry, WSE 2012
Location: 
Leipzig
Period: 
March 5-7, 2012
Presentation method: 
Poster Presentation