Ambiguous Role of Growth-Induced Defects on the Semiconductor-to-Metal Characteristics in Epitaxial VO2/TiO2 Thin Films

Publication type: 
Journal
Authors: 
Mihailescu, CN; Symeou, E; Svoukis, E; Negrea, RF; Ghica, C; Teodorescu, V; Tanase, LC; Negrila, C; Giapintzakis, J
Year: 
2018
DOI: 
http://dx.doi.org/10.1016/j.tsf.2018.03.062

Book data

Pag.: 
1 1

Journal data

Journal: 
ACS APPLIED MATERIALS & INTERFACES
Vol.: 
10
Pag.: 
1 1