![fiipregatit](https://inflpr.ro/sites/all/themes/fast.png)
Reflection Z-scan for characterization of materials with third- and fifth-order optical nonlinearities
Publication type:
Conference / Workshop
Year:
2009 Conference / Workshop data
Conference / Workshop:
3rd EOS Topical Meeting on Optical Microsystems (OMS09)
Location:
Capri, Italy
Period:
27-30.09.2009
Presentation method:
Poster