AlN:Cr thin films synthesized by pulsed laser deposition: studies by X-ray diffraction and spectroscopic ellipsometry
- 2009 |
- Publications |
- Journals
Publication type:
Journal
Year:
2009 Journal data
Journal:
Applied Surface Science
Vol.:
255 (10)
Pag.:
5271 - 5274
ISI factor:
1.576