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Home
» 2012
Dr. Radut
2012
GROWTH AND CHARACTERIZATIONS OF NANOSTRUCTURED TUNGSTEN OXIDES
Authors:
Filipescu, M; Ion, V; Colceag, D; Ossi, PM; Dinescu, M
Year:
2012
Journal data
Journal:
ROMANIAN REPORTS IN PHYSICS
Vol.:
64
Pag.:
1213 1225
REVIEW OF THE PROCESSES IDENTIFIED DURING THE POLYMERIZATION OF ORGANIC AND ORGANOSILICON LIQUID FILMS IN ATMOSPHERIC PRESSURE AIR CORONA DISCHARGES
Authors:
Groza, A
Year:
2012
Journal data
Journal:
ROMANIAN REPORTS IN PHYSICS
Vol.:
64
Pag.:
1227 1242
PUMP INTENSITY DEPENDENCE OF EMISSION QUANTUM EFFICIENCY IN Nd-DOPED MATERIALS
Authors:
Lupei, V
Year:
2012
Journal data
Journal:
ROMANIAN REPORTS IN PHYSICS
Vol.:
64
Pag.:
1291 1305
Optical fibre radiation dosimeter for radiotherapy applications
Authors:
McCarthy, D; O'Keeffe, S; Lewis, E; Sporea, D; Sporea, A; Tiseanu, I; Woulfe, P; Cronin, J
Year:
2012
Journal data
Journal:
2012 IEEE SENSORS PROCEEDINGS
Vol.:
0
Pag.:
858 861
Structural and morphological characterization of Pr3+ and Er3+-containing SiO2-P2O5 sol-gel thin films
Authors:
Elisa, M; Sava, BA; Vasiliu, IC; Nastase, F; Nastase, C; Volceanov, A; Stoleriu, S
Year:
2012
DOI:
http://dx.doi.org/10.1016/j.matchemphys.2011.10.031
Journal data
Journal:
MATERIALS CHEMISTRY AND PHYSICS
Vol.:
131
Pag.:
647 665
R-3 measurement by White Light Interferometry
Authors:
Bojan, M; Apostol, D; Cernescu, N; Iordache, I; Damian, V; Schiopu, P
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.974491
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 841106
Optical analyses of pulsed interferometric patterning of azo-polysiloxanes
Authors:
Damian, V; Apostol, I; Hurduc, N; Bojan, M; Udrea, C
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.966848
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 841128
Phase-shifting interferometry with a reflective diffraction grating for adaptive optics
Authors:
Garoi, F; Logofatu, PC; Apostol, D; Udrea, C
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.966844
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 84110R
Sampling theorem: the cornerstone of discrete optics
Authors:
Logofatu, PC; Nascov, V
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.934818
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 84110F
Laser methods for pharmaceutical pollutants removal
Authors:
Smarandache, A; Militaru, A; Goker, H; Pascu, A; Pascu, ML
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.966414
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 84111E
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