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Dr. Radut
PUBLICATIONS
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JOURNALS
PATENTS
Publication title
Authors
Year
Journals
Structural and morphological characterization of Pr3+ and Er3+-containing SiO2-P2O5 sol-gel thin films
Authors:
Elisa, M; Sava, BA; Vasiliu, IC; Nastase, F; Nastase, C; Volceanov, A; Stoleriu, S
Year:
2012
DOI:
http://dx.doi.org/10.1016/j.matchemphys.2011.10.031
Journal data
Journal:
MATERIALS CHEMISTRY AND PHYSICS
Vol.:
131
Pag.:
647 665
R-3 measurement by White Light Interferometry
Authors:
Bojan, M; Apostol, D; Cernescu, N; Iordache, I; Damian, V; Schiopu, P
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.974491
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 841106
Optical analyses of pulsed interferometric patterning of azo-polysiloxanes
Authors:
Damian, V; Apostol, I; Hurduc, N; Bojan, M; Udrea, C
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.966848
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 841128
Phase-shifting interferometry with a reflective diffraction grating for adaptive optics
Authors:
Garoi, F; Logofatu, PC; Apostol, D; Udrea, C
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.966844
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 84110R
Sampling theorem: the cornerstone of discrete optics
Authors:
Logofatu, PC; Nascov, V
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.934818
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 84110F
Laser methods for pharmaceutical pollutants removal
Authors:
Smarandache, A; Militaru, A; Goker, H; Pascu, A; Pascu, ML
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.966414
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 84111E
Aluminum nanoparticles production with laser ablation in liquids
Authors:
Udrea, C; Bojan, M; Iordache, I; Apostol, I; Damian, V
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.977951
Journal data
Journal:
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI
Vol.:
8411
Pag.:
UNSP 841124
SOLUBILITY LIMITS OF ERBIUM IN PARTIALLY DISORDERED CRYSTALS LANGANITE AND LANGATATE
Authors:
Toma, O; Gheorghe, L; Birjega, R
Year:
2012
Journal data
Journal:
ROMANIAN JOURNAL OF PHYSICS
Vol.:
57
Pag.:
1375 1381
SPECTRAL PROPERTIES IN PHOTODYNAMIC PLASMA THERAPY APPLICATIONS
Authors:
Chiru, P; Jepu, I; Porosnicu, C; Lungu, AM; Lungu, CP
Year:
2012
Journal data
Journal:
ROMANIAN JOURNAL OF PHYSICS
Vol.:
57
Pag.:
1403 1410
Automated test station for laser-induced damage threshold measurements according to ISO 21254-1,2,3,4 standards
Authors:
Stratan, A; Zorila, A; Rusen, L; Simion, S; Blanaru, C; Fenic, C; Neagu, L; Nemes, G
Year:
2012
DOI:
http://dx.doi.org/10.1117/12.976845
Journal data
Journal:
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2012
Vol.:
8530
Pag.:
85301Y
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