D retention and material defects probed using Raman microscopy in JET limiter samples and beryllium-based synthesized samples

Pardanaud, C; Kumar, M; Roubin, P; Martin, C; Ferro, Y; Denis, J; Widdowson, A; Douai, D; Baldwin, MJ; Zaloznik, A; Lungu, C; Porosnicu, C; Dinca, P; Dittmar, T; Hakola, A