Preparation and characterization of Copper/Nikel nanostructurated multilayers using thermionic vacuum Arc method

Publication type: 
Journal
Autori: 
Ilie, D; Rasleanu, D; Ionescu, V; Mocanu, V; Muresan, MG; Oancea-Stanescu, IM; Ciupina, V; Prodan, G; Vasile, E; Mustata, I; Zaroschi, V; Lungu, CP
Anul: 
2010

Journal data

Journal: 
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS
Vol.: 
12
Pag.: 
839 843