Stress study of thin As-Se-Ag films obtained by vacuum thermal evaporation and pulsed laser deposition

Publication type: 
Journal
Autori: 
Petkova, T; Ilcheva, V; Petkov, P; Socol, G; Ristoscu, C; Sima, F; Mihailescu, CN; Mihailescu, IN; Popov, C; Boev, V; Reithmaier, JP
Anul: 
2010

Journal data

Journal: 
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS
Vol.: 
12
Pag.: 
650 653