Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique

Publication type: 
Journal
Autori: 
Mirchin, N; Apter, B; Lapsker, I; Fogel, V; Gorodetsky, U; Popescu, SA; Peled, A; Popescu-Pelin, G; Dorcioman, G; Duta, L; Popescu, A; Mihailescu, IN
Anul: 
2012
DOI: 
http://dx.doi.org/10.1166/jnn.2012.5788

Journal data

Journal: 
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Vol.: 
12
Pag.: 
2668 2671