Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique

Mirchin, N; Apter, B; Lapsker, I; Fogel, V; Gorodetsky, U; Popescu, SA; Peled, A; Popescu-Pelin, G; Dorcioman, G; Duta, L; Popescu, A; Mihailescu, IN