Interface characterization and atomic intermixing processes in Be/W bilayers deposited on Si(001) substrates with Fe buffer layers

Publication type:

Journal

Autori:

Kuncser, V; Palade, P; Schinteie, G; Sandu, SG; Trupina, L; Lungu, GA; Gheorghe, NG; Teodorescu, CM; Porosnicu, C; Jepu, I; Lungu, CP; Filoti, G

Anul:

2012

DOI:

http://dx.doi.org/10.1016/j.jallcom.2011.09.063

Journal data

Journal:

JOURNAL OF ALLOYS AND COMPOUNDS

Vol.:

512

Pag.:

199 206