Study of the charge transport mechanism in pulsed laser deposited AlN:Si films

Publication type:

Journal

Autori:

Minkov, IP; Simeonov, S; Szekeres, A; Cziraki, A; Socol, G; Ristoscu, C; Mihailescu, IN

Anul:

2012

DOI:

http://dx.doi.org/10.1088/1742-6596/356/1/012038

Journal data

Journal:

17TH INTERNATIONAL SUMMER SCHOOL ON VACUUM, ELECTRON, AND ION TECHNOLOGIES (VEIT 2011)

Vol.:

356

Pag.:

12038