Structural and dielectric properties of Ba(X1/3Ta2/3)O-3 thin films grown by RF-PLD

Publication type:

Journal

Autori:

Nedelcu, L; Scarisoreanu, ND; Chirila, C; Busuioc, C; Banciu, MG; Jinga, SI; Dinescu, M

Anul:

2013

DOI:

http://dx.doi.org/10.1016/j.apsusc.2012.10.124

Journal data

Journal:

APPLIED SURFACE SCIENCE

Vol.:

278

Pag.:

158 161