Structural and dielectric properties of Ba(X1/3Ta2/3)O-3 thin films grown by RF-PLD

Publication type: 
Journal
Autori: 
Nedelcu, L; Scarisoreanu, ND; Chirila, C; Busuioc, C; Banciu, MG; Jinga, SI; Dinescu, M
Anul: 
2013
DOI: 
http://dx.doi.org/10.1016/j.apsusc.2012.10.124

Journal data

Journal: 
APPLIED SURFACE SCIENCE
Vol.: 
278
Pag.: 
158 161