Structural and morphological studies of Nd-doped phosphate thin films deposited by PLD on silicon wafers

Publication type: 
Journal
Autori: 
Iordanescu, CR; Feraru, ID; Elisa, M; Vasiliu, IC; Volceanov, A; Stoleriu, S; Filipescu, M
Anul: 
2014

Journal data

Journal: 
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS
Vol.: 
16
Pag.: 
288 294