Structural and morphological studies of Nd-doped phosphate thin films deposited by PLD on silicon wafers

Publication type:

Journal

Autori:

Iordanescu, CR; Feraru, ID; Elisa, M; Vasiliu, IC; Volceanov, A; Stoleriu, S; Filipescu, M

Anul:

2014

Journal data

Journal:

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS

Vol.:

Pag.:

288 294