BISMUTH OXIDE THIN FILMS DEPOSITED ON SILICON THROUGH PULSED LASER ABLATION, FOR INFRARED DETECTORS

Publication type: 
Journal
Autori: 
Condurache-Bota, S; Constantinescu, C; Tigau, N; Praisler, M
Anul: 
2016
DOI: 
http://dx.doi.org/10.1142/S0218625X15501048

Journal data

Journal: 
SURFACE REVIEW AND LETTERS
Vol.: 
23
Pag.: 
1550104