Raman microscopy investigation of beryllium materials

Pardanaud, C; Rusu, MI; Giacometti, G; Martin, C; Addab, Y; Roubin, P; Lungu, CP; Porosnicu, C; Jepu, I; Dinca, P; Lungu, M; Pompilian, OG; Mateus, R; Alves, E; Rubel, M