Characterization of nitrogen doped silicon-carbon multi-layer nanostructures obtained by TVA method

Publication type: 
Journal
Autori: 
Ciupina, V; Vasile, E; Porosnicu, C; Prodan, GC; Lungu, CP; Vladoiu, R; Jepu, I; Mandes, A; Dinca, V; Caraiane, A; Nicolescu, V; Dinca, P; Zaharia, A
Anul: 
2016
DOI: 
http://dx.doi.org/10.1117/12.2237156

Journal data

Journal: 
NANOSTRUCTURED THIN FILMS IX
Vol.: 
9929