Characterization of nitrogen doped silicon-carbon multi-layer nanostructures obtained by TVA method

Publication type:

Journal

Autori:

Ciupina, V; Vasile, E; Porosnicu, C; Prodan, GC; Lungu, CP; Vladoiu, R; Jepu, I; Mandes, A; Dinca, V; Caraiane, A; Nicolescu, V; Dinca, P; Zaharia, A

Anul:

2016

DOI:

http://dx.doi.org/10.1117/12.2237156

Journal data

Journal:

NANOSTRUCTURED THIN FILMS IX

Vol.:

9929