OPTICAL AND STRUCTURAL CHARACTERIZATION OF YSZ THIN FILMS DEPOSITED BY EXCIMER LASER ABLATION FOR PLANAR POTENTIOMETRIC OXYGEN SENSORS APPLICATIONS

Publication type: 
Journal
Autori: 
Pascu, R; Epurescu, G; Moldovan, A; Birjega, R; Luculescu, C; Colceag, D; Dinescu, M
Anul: 
2016

Journal data

Journal: 
ROMANIAN REPORTS IN PHYSICS
Vol.: 
68
Pag.: 
1189 1196