OPTICAL AND STRUCTURAL CHARACTERIZATION OF YSZ THIN FILMS DEPOSITED BY EXCIMER LASER ABLATION FOR PLANAR POTENTIOMETRIC OXYGEN SENSORS APPLICATIONS

Publication type:

Journal

Autori:

Pascu, R; Epurescu, G; Moldovan, A; Birjega, R; Luculescu, C; Colceag, D; Dinescu, M

Anul:

2016

Journal data

Journal:

ROMANIAN REPORTS IN PHYSICS

Vol.:

Pag.:

1189 1196