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INFRARED AND X-RAY PHOTOELECTRON SPECTROSCOPY IN SURFACE CHARACTERIZATION OF POLYDIMETHYLSILOXANE THIN FILMS GENERATED ON METALLIC SUBSTRATES IN MULTIPOINTS TO PLANE CORONA DISCHARGES
- 2016 |
- Publications |
- Journals
Publication type:
Journal
Anul:
2016 Journal data
Journal:
ROMANIAN JOURNAL OF PHYSICS
Vol.:
61
Pag.:
648 656