Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials

Publication type: 
Conference / Workshop
Autori: 
Petre C?t?lin Logof?tu, Cristian Udrea, Valentin Ion, Nicu Doinel Sc?ri?oreanu and Raluca M?ller
Anul: 
2010
DOI: 
http://dx.doi.org/10.1117/12.882140

Conference / Workshop data

Conference / Workshop: 
ATOM-N 2010
Location: 
Constanta, Romania
Period: 
2010

Journal data

Journal: 
Proc. SPIE
Vol.: 
7821
Pag.: 
782114