Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials

Publication type:

Conference / Workshop

Autori:

Petre C?t?lin Logof?tu, Cristian Udrea, Valentin Ion, Nicu Doinel Sc?ri?oreanu and Raluca M?ller

Anul:

2010

DOI:

http://dx.doi.org/10.1117/12.882140

Conference / Workshop data

Conference / Workshop:

ATOM-N 2010

Location:

Constanta, Romania

Period:

2010

Journal:

Proc. SPIE

Vol.:

7821

Pag.:

782114