Studies on the dielectric properties of YSZ doped 10% Ni thin films deposited by PLD and RF PLD at different substrate temperature

Publication type:

Conference / Workshop

Autori:

R. Pascu, G. Epurescu, V. Ion, F. Stokker, A. Andrei, M. Dinescu

Anul:

2012

Conference / Workshop data

Conference / Workshop:

Symposium: X, Quantitative Microscopy of Energy Materials, E-MRS 2012 SPRING MEETING, Technical sessions

Location:

Strasbourg, Franta

Period:

May 14-18, 2012

Presentation method:

Poster Presentation