Studies on the dielectric properties of YSZ doped 10% Ni thin films deposited by PLD and RF PLD at different substrate temperature

Publication type: 
Conference / Workshop
Autori: 
R. Pascu, G. Epurescu, V. Ion, F. Stokker, A. Andrei, M. Dinescu
Anul: 
2012

Conference / Workshop data

Conference / Workshop: 
Symposium: X, Quantitative Microscopy of Energy Materials, E-MRS 2012 SPRING MEETING, Technical sessions
Location: 
Strasbourg, Franta
Period: 
May 14-18, 2012
Presentation method: 
Poster Presentation