Spectroscopic ellipsometry studies on amorphous oxide semiconductors

Publication type: 
Conference / Workshop
Autori: 
A. C. Galca, O. Fufa, D. Craciun, C. Besleaga, V. Craciun
Anul: 
2017

Conference / Workshop data

Conference / Workshop: 
The 9th International Conference on Advanced Materials, ROCAM
Location: 
Bucharest
Period: 
11 - 14 July 2017