Spectroscopic ellipsometry studies on amorphous oxide semiconductors

Publication type:

Conference / Workshop

Autori:

A.C. Galca; O. Fufa; D. Craciun; C. Besleaga; V. Craciun

Anul:

2017

Conference / Workshop data

Conference / Workshop:

The 9th International Conference on Advanced Materials (ROCAM)

Location:

Bucuresti, Romania

Period:

11 – 14 July 2017

Presentation method:

Oral Presentation