Spectroscopic ellipsometry studies on amorphous oxide semiconductors

Publication type: 
Conference / Workshop
Autori: 
A.C. Galca; O. Fufa; D. Craciun; C. Besleaga; V. Craciun
Anul: 
2017

Conference / Workshop data

Conference / Workshop: 
The 9th International Conference on Advanced Materials (ROCAM)
Location: 
Bucuresti, Romania
Period: 
11 – 14 July 2017
Presentation method: 
Oral Presentation