Ambiguous Role of Growth-Induced Defects on the Semiconductor-to-Metal Characteristics in Epitaxial VO2/TiO2 Thin Films

Publication type:

Journal

Autori:

Mihailescu, CN; Symeou, E; Svoukis, E; Negrea, RF; Ghica, C; Teodorescu, V; Tanase, LC; Negrila, C; Giapintzakis, J

Anul:

2018

DOI:

http://dx.doi.org/10.1016/j.tsf.2018.03.062

Book data

Pag.:

1 1

Journal:

ACS APPLIED MATERIALS & INTERFACES

Vol.:

Pag.:

1 1