Reflection Z-scan for characterization of materials with third- and fifth-order optical nonlinearities

Publication type: 
Conference / Workshop
Autori: 
A. Petris, V. I. Vlad, E. Fazio
Number of authors: 
3
Anul: 
2009

Conference / Workshop data

Conference / Workshop: 
3rd EOS Topical Meeting on Optical Microsystems (OMS09)
Location: 
Capri, Italy
Period: 
27-30.09.2009
Presentation method: 
Poster