Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays

Niozu, A; Kumagai, Y; Nishiyama, T; Fukuzawa, H; Motomura, K; Bucher, M; Asa, K; Sato, Y; Ito, Y; Takanashi, T; You, D; Ono, T; Li, YW; Kukk, E; Miron, C; Neagu, L; Callegari, C; Di Fraia, M; Rossi, G; Galli, DE; Pincelli, T; Colombo, A; Owada, S; Tono, K; Kameshima, T; Joti, Y; Katayama, T; Togashi, T; Yabashi, M; Matsuda, K; Nagaya, K; Bostedt, C; Ueda, K