Radiation hardness of GaAs: Cr and Si sensors irradiated by electron beam

Publication type: 
Journal
Autori: 
Kruchonak, U; Abou El-Azm, S; Afanaciev, K; Chelkov, G; Demichev, M; Gostkin, M; Guskov, A; Firu, E; Kobets, V; Leyva, A; Nozdrin, A; Porokhovoy, S; Sheremetyeva, A; Smolyanskiy, P; Torres, A; Tyazhev, A; Tolbanov, O; Zamyatin, N; Zarubin, A; Zhemchugov, A
Anul: 
2020
DOI: 
http://dx.doi.org/10.1016/j.nima.2020.164204

Journal data

Journal: 
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Vol.: 
975
Pag.: 
164204