Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Niozu, A; Kumagai, Y; Nishiyama, T; Fukuzawa, H; Motomura, K; Bucher, M; Ito, Y; Takanashi, T; Asa, K; Sato, Y; You, D; Li, Y; Ono, T; Kukk, E; Miron, C; Neagu, L; Callegari, C; Di Fraia, M; Rossi, G; Galli, DE; Pincelli, T; Colombo, A; Kameshima, T; Joti, Y; Hatsui, T; Owada, S; Katayama, T; Togashi, T; Tono, K; Yabashi, M; Matsuda, K; Bostedt, C; Nagaya, K; Ueda, K