2013

Transition voltage spectroscopy reveals significant solvent effects on molecular transport and settles an important issue in bipyridine-based junctions

Autori: 
Baldea, I
Anul: 
2013
DOI: 
http://dx.doi.org/10.1039/c3nr51290h

REAL-TIME DETECTION OF OPTICAL DAMAGE INDUCED BY HIGH-POWER LASER PULSES

Autori: 
Zorila, A; Simion, S; Rusen, L; Stratan, A; Schiopu, P
Anul: 
2013

ETHYLENE CONCENTRATION AT FRUITS UNDER AEROBIC vs. ANAEROBIC CONDITIONS

Autori: 
Banita, S; Popa, C; Patachia, M; Dumitras, DC
Anul: 
2013

ELECTRON COLLISIONS WITH Fe-PEAK ELEMENT Co IV: A COMPUTATIONAL GRAND CHALLENGE

Autori: 
Stancalie, V
Anul: 
2013

PARAMAGNETIC POINT DEFECTS IN PURE AND C-13 AND O-17 IMPLANTED SILICON FOR HIGH ENERGY PARTICLE DETECTORS

Autori: 
Nistor, SV; Ghica, D; Pintilie, I; Manaila, E
Anul: 
2013

THE GAS TEMPERATURE DETERMINATION IN THE PULSED HOLLOW CATHODE DISCHARGE

Autori: 
Surmeian, A; Groza, A; Diplasu, C; Atanasiu, C; Popescu, A; Savastru, D; Ganciu, M
Anul: 
2013

OPTICAL BRIGHT SOLITONS IN LITHIUM NIOBATE AND THEIR APPLICATIONS

Autori: 
Fazio, E; Petris, A; Bertolotti, M; Vlad, VI
Anul: 
2013

EXPERIMENTAL INVESTIGATION OF THE OUTPUT MODE PROFILE OF SOLITON WAVEGUIDES RECORDED AT 405 NM WAVELENGTH IN LITHIUM NIOBATE

Autori: 
Popescu, ST; Petris, A; Vlad, VI
Anul: 
2013

LASER EMISSION IN DIODE-PUMPED Nd:YAG SINGLE-CRYSTAL WAVEGUIDES REALIZED BY DIRECT FEMTOSECOND-LASER WRITING TECHNIQUE

Autori: 
Salamu, G; Voicu, F; Pavel, N; Dascalu, T; Jipa, F; Zamfirescu, M
Anul: 
2013

MEASUREMENT OF THE NONLINEAR REFRACTIVE INDEX OF SOME SILICON NANOSTRUCTURES USING REFLECTION INTENSITY SCAN METHOD

Autori: 
Rujoiu, TB; Vlad, VI; Petris, A
Anul: 
2013
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