Journals

Carbon layers cleaning from inside of narrow gaps by a RF glow discharge

Autori: 
Stancu, C; Teodorescu, M; Galca, AC; Dinescu, G
Anul: 
2011
DOI: 
http://dx.doi.org/10.1016/j.surfcoat.2011.03.090

X-ray microbeam transmission/fluorescence method for non-destructive characterization of tungsten coated carbon materials

Autori: 
Tiseanu, I; Mayer, M; Craciunescu, T; Hakola, A; Koivuranta, S; Likonen, J; Ruset, C; Dobrea, C
Anul: 
2011
DOI: 
http://dx.doi.org/10.1016/j.surfcoat.2011.03.049

Effects of pulsed laser radiation on epitaxial self-assembled Ge quantum dots grown on Si substrates

Autori: 
del Pino, AP; Gyorgy, E; Marcus, IC; Roqueta, J; Alonso, MI
Anul: 
2011
DOI: 
http://dx.doi.org/10.1088/0957-4484/22/29/295304

Reply to "Comment on 'Critical analysis of a variational method used to describe molecular electron transport'"

Autori: 
Baldea, I; Koppel, H
Anul: 
2011
DOI: 
http://dx.doi.org/10.1103/PhysRevB.84.037305

Acid-base properties of the active sites responsible for C-2(+) and CO2 formation over MO-Sm2O3 (M = Zn, Mg, Ca and Sr) mixed oxides in OCM reaction

Autori: 
Papa, F; Luminita, P; Osiceanu, P; Birjega, R; Akane, M; Balint, I
Anul: 
2011
DOI: 
http://dx.doi.org/10.1016/j.molcata.2011.06.008

Higher Harmonic Anisotropic Flow Measurements of Charged Particles in Pb-Pb Collisions at root s(NN)=2.76 TeV

Autori: 
Aamodt, K; Abelev, B; Quintana, AA; Adamova, D; Adare, AM; Aggarwal, MM; Rinella, GA; Agocs, AG; Agostinelli, A; Salazar, SA; Ahammed, Z; Ahmad, N; Masoodi, AA; Ahn, SU; Akindinov, A; Aleksandrov, D; Alessandro, B; Molina, RA; Alici, A; Alkin, A; Avina, EA; Alt, T; Altini, V; Altsybeev, I; Andrei, C; Andronic, A; Anguelov, V; Anson, C; Anticic, T; Antinori, F; Antonioli, P; Aphecetche, L; Appelshauser, H; Arbor, N; Arcelli, S; Arend, A; Armesto, N; Arnaldi, R; Aronsson, T; Arsene, IC; Arslandok, M; Asryan, A; Augustinus, A; Averbeck, R; Awes, TC; Aysto, J; Azmi, MD; Bach, M; Badala, A; Baek, Y
Anul: 
2011
DOI: 
http://dx.doi.org/10.1103/PhysRevLett.107.032301

Annealing of hydrogen-induced defects in RF-plasma-treated Si wafers: ex situ and in situ transmission electron microscopy studies

Autori: 
Ghica, C; Nistor, LC; Vizireanu, S; Dinescu, G
Anul: 
2011
DOI: 
http://dx.doi.org/10.1088/0022-3727/44/29/295401

OES monitoring of sequential deposition of C/W layers by PECVD/magnetron sputtering techniques

Autori: 
Acsente, T; Ionita, ER; Stancu, C; Ionita, MD; Dinescu, G; Grisolia, C
Anul: 
2011
DOI: 
http://dx.doi.org/10.1016/j.surfcoat.2011.03.085

Periodicity property of relativistic Thomson scattering with application to exact calculations of angular and spectral distributions of the scattered field

Autori: 
Popa, A
Anul: 
2011
DOI: 
http://dx.doi.org/10.1103/PhysRevA.84.023824

Synthesis and Laser Immobilization onto Solid Substrates of CdSe/ZnS Core Shell Quantum Dots

Autori: 
Gyorgy, E; del Pino, AP; Roqueta, J; Ballesteros, B; Miguel, AS; Maycock, CD; Oliva, AG
Anul: 
2011
DOI: 
http://dx.doi.org/10.1021/jp203051b
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