2012 | Institutul National pentru Fizica Laserilor, Plasmei si Radiatiei

THE ENERGY CALIBRATION OF THE BUCHAREST FN TANDEM ACCELERATOR

Autori:

Nita, CR; Pantelica, D; Cata-Danil, G; Petrascu, H; Velisa, G; Ionescu, P; Ghita, DG; Filipescu, M

Anul:

2012

Journal data

Journal:

UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN-SERIES A-APPLIED MATHEMATICS AND PHYSICS

Vol.:

74

Pag.:

141 152

NUMERICAL SIMULATION AND IN VITRO EXPERIMENTAL TEMPERATURE DISTRIBUTION ANALYSIS IN IRRADIATED TISSUE

Autori:

Petrus, M; Dumitras, DC

Anul:

2012

Journal data

Journal:

UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN-SERIES A-APPLIED MATHEMATICS AND PHYSICS

Vol.:

74

Pag.:

167 176

APPLICATION OF CARBON-ALUMINUM NANOSTRUCTURES IN DIVERTORS COATINGS FROM FUSION REACTOR

Autori:

Ciupina, V; Lungu, CP; Vladoiu, R; Epure, TD; Prodan, G; Porosnicu, C; Prodan, M; Stanescu, IM; Contulov, M; Mandes, A; Dinca, V; Zarovschi, V

Anul:

2012

DOI:

http://dx.doi.org/10.1117/12.930443

Journal data

Journal:

NANOSTRUCTURED THIN FILMS V

Vol.:

8465

Pag.:

846508

On the Possibility to Discriminate the Mass of the Primary Cosmic Ray Using the Muon Arrival Times from Extensive Air Showers: Application for Pierre Auger Observatory.

Autori:

Arsene, N; Rebel, H; Sima, O

Anul:

2012

DOI:

http://dx.doi.org/10.1063/1.4768508

Journal data

Journal:

EXOTIC NUCLEI AND NUCLEAR/PARTICLE ASTROPHYSICS (IV): FROM NUCLEI TO STARS

Vol.:

1498

Pag.:

304 308

Structural and morphological characterization of Pr3+ and Er3+-containing SiO2-P2O5 sol-gel thin films

Autori:

Elisa, M; Sava, BA; Vasiliu, IC; Nastase, F; Nastase, C; Volceanov, A; Stoleriu, S

Anul:

2012

DOI:

http://dx.doi.org/10.1016/j.matchemphys.2011.10.031

Journal data

Journal:

MATERIALS CHEMISTRY AND PHYSICS

Vol.:

131

Pag.:

647 665

R-3 measurement by White Light Interferometry

Autori:

Bojan, M; Apostol, D; Cernescu, N; Iordache, I; Damian, V; Schiopu, P

Anul:

2012

DOI:

http://dx.doi.org/10.1117/12.974491

Journal data

Journal:

ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI

Vol.:

8411

Pag.:

UNSP 841106

Optical analyses of pulsed interferometric patterning of azo-polysiloxanes

Autori:

Damian, V; Apostol, I; Hurduc, N; Bojan, M; Udrea, C

Anul:

2012

DOI:

http://dx.doi.org/10.1117/12.966848

Journal data

Journal:

ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI

Vol.:

8411

Pag.:

UNSP 841128

Phase-shifting interferometry with a reflective diffraction grating for adaptive optics

Autori:

Garoi, F; Logofatu, PC; Apostol, D; Udrea, C

Anul:

2012

DOI:

http://dx.doi.org/10.1117/12.966844

Journal data

Journal:

ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI

Vol.:

8411

Pag.:

UNSP 84110R

Laser methods for pharmaceutical pollutants removal

Autori:

Smarandache, A; Militaru, A; Goker, H; Pascu, A; Pascu, ML

Anul:

2012

DOI:

http://dx.doi.org/10.1117/12.966414

Journal data

Journal:

ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI

Vol.:

8411

Pag.:

UNSP 84111E

Sampling theorem: the cornerstone of discrete optics

Autori:

Logofatu, PC; Nascov, V

Anul:

2012

DOI:

http://dx.doi.org/10.1117/12.934818

Journal data

Journal:

ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI

Vol.:

8411

Pag.:

UNSP 84110F